Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera

被引:3
|
作者
Wobrauschek, P
Streli, C
Pepponi, G
Bergmann, A
Glatter, O
机构
[1] Univ Vienna, Inst Atom, A-1020 Vienna, Austria
[2] Anton Paar GmbH, Graz, Austria
[3] Inst Chem, Graz, Austria
关键词
The authors would like to thank Walter Drabek from the Atominstitut for the machining of the mechanical components and Rupert Schwarzl from the Institute of Chemistry for his help during the preparation of the experiment and the FWF (# PHY14336) for financial support;
D O I
10.1016/S0168-9002(02)00463-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Combining the high photon flux from a rotating anode X-ray tube with an X-ray optical component to focus and monochromatize the X-ray beam is the most promising instrumentation for best detection limits in the modern XRF laboratory. This is realized by using the design of a high flux SAXS camera in combination with a 4 kW high brilliant rotating Cu anode X-ray tube with a graded elliptically bent multilayer and including a new designed module for excitation in total reflection geometry within the beam path, The system can be evacuated thus reducing absorption and scattering of air and removing the argon peak in the spectra. Another novelty is the use of a Peltier cooled drift detector with an energy resolution of 148 eV at 5.9 keV and 5 mm(2) area. For Co detection limits of about 300 fg determined by a single element standard have been achieved, Testing a real sample NIST 1643d led to detection limits in the range of 300 ng/l for the medium Z. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码:569 / 572
页数:4
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