Delay hazards in complex gate based speed independent VLSI circuits

被引:1
|
作者
Tabrizi, N [1 ]
Liebelt, MJ [1 ]
Eshraghian, K [1 ]
机构
[1] UNIV ADELAIDE,DEPT ELECT & ELECTR ENGN,ADELAIDE,SA 5005,AUSTRALIA
关键词
asynchronous circuits; hazards; isochronic forks; signal transition graphs (STGs); speed independent circuits (SICs);
D O I
10.1109/GLSV.1996.497631
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:266 / 271
页数:6
相关论文
共 50 条
  • [41] Behavioral EMI models of complex digital VLSI circuits
    Steinecke, T
    Koehne, H
    Schmidt, M
    MICROELECTRONICS JOURNAL, 2004, 35 (06) : 547 - 555
  • [42] Behavioral EMI models of complex digital VLSI circuits
    Steinecke, T
    Koehne, H
    Schmidt, M
    2003 IEEE International Symposium on Electromagnetic Compatibility (EMC), Vols 1 and 2, Symposium Record, 2003, : 848 - 851
  • [43] Projection based fast passive compact macromodeling of high-speed VLSI circuits and interconnects
    Saraswat, D
    Achar, R
    Nakhla, M
    18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS, 2005, : 629 - 633
  • [44] A statistical methodology for modeling and analysis of path delay faults in VLSI circuits
    Hamad, M
    Al-Arian, S
    Landis, D
    COMPUTERS & ELECTRICAL ENGINEERING, 1997, 23 (05) : 319 - 328
  • [45] Effects of delay models on peak power estimation of VLSI sequential circuits
    Hsiao, MS
    Rudnick, EM
    Patel, JH
    1997 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS, 1997, : 45 - 51
  • [46] A novel algorithm for testing crosstalk induced delay faults in VLSI circuits
    Aniket
    Arunachalam, R
    18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS, 2005, : 479 - 484
  • [47] Modeling and analysis of path delay faults in VLSI circuits: A statistical approach
    Hamad, M
    Cherri, AK
    ICECS 2003: PROCEEDINGS OF THE 2003 10TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3, 2003, : 587 - 590
  • [48] Delay estimation of VLSI circuits from a high-level view
    Nemani, M
    Najm, FN
    1998 DESIGN AUTOMATION CONFERENCE, PROCEEDINGS, 1998, : 591 - 594
  • [49] Effects of inductance on the propagation delay and repeater insertion in VLSI circuits: A summary
    Ismall, Yehea I.
    Friedman, Eby G.
    IEEE Circuits and Systems Magazine, 2003, 3 (01) : 24 - 28
  • [50] SEMIMODULARITY AND TESTABILITY OF SPEED-INDEPENDENT CIRCUITS
    BEEREL, PA
    MENG, THY
    INTEGRATION-THE VLSI JOURNAL, 1992, 13 (03) : 301 - 322