Strain induced anisotropic effect on electron mobility in C60 based organic field effect transistors

被引:43
|
作者
Nigam, Akash [1 ,2 ,3 ]
Schwabegger, Guenther [4 ]
Ullah, Mujeeb [4 ]
Ahmed, Rizwan [4 ,5 ]
Fishchuk, Ivan I. [6 ]
Kadashchuk, Andrey [6 ,7 ]
Simbrunner, Clemens [4 ]
Sitter, Helmut [4 ]
Premaratne, Malin [1 ,2 ]
Rao, V. Ramgopal [1 ,3 ]
机构
[1] Indian Inst Technol, IITB Monash Res Acad, Mumbai 400076, Maharashtra, India
[2] Monash Univ, Dept Elect & Comp Syst Engn, Clayton, Vic 3800, Australia
[3] Indian Inst Technol, Ctr Excellence Nanoelect, Dept Elect Engn, Mumbai 400076, Maharashtra, India
[4] Johannes Kepler Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria
[5] Natl Ctr Phys, Islamabad, Pakistan
[6] Natl Acad Sci Ukraine, Inst Phys, UA-03028 Kiev, Ukraine
[7] IMEC, B-3001 Louvain, Belgium
关键词
D O I
10.1063/1.4747451
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electron mobility was found to increase (decrease) upon applied compressive (tensile) strain, respectively, when a high-performance flexible C-60-based organic field-effect transistor (OFET) was subjected to different bending radii. The observed almost twofold relative change in the electron mobility is considerably larger than that reported before for pentacene-based OFETs. Moreover, the strain dependency of electron mobility in C-60 films is strongly anisotropic with respect to the strain direction measured relative to the current flow. Analysis within a hopping-transport model for OFET mobility suggests that the observed strain dependency on electron transport is dominated mostly by the change of inter-grain coupling in polycrystalline C-60 films. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4747451]
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页数:4
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