Sliding friction by atomic force microscopy

被引：0
|
作者：
Pasquier, V [1 ]
Drake, JM [1 ]
机构：
[1] Exxon Res & Engn Co, Annandale, NJ 08801 USA
来源：
DYNAMICS IN SMALL CONFINING SYSTEMS IV | 1999年 / 543卷
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Lateral Force Microscopy offers the possibility of exploring tribological properties of interfaces at the nanoscale. Our research focused on some crucial conditions that must be fulfilled to obtain quantitative and reliable LFM friction measurements. We have characterized the mechanical and vibrational properties of the cantilever. Precise force calibration were made based on our knowledge of the intrinsic coupling modes of the cantilever. We report measurements of the sliding friction between two silica surfaces. The load dependence of the friction force was analyzed assuming different models for the contact, from Hertzian to Amontons law.
引用
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页码：51 / 61
页数：11
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