Fast Model Generation for AlGaN/GaN HEMTs with the Consideration of Self-heating and Charge Trapping Effects

被引:0
|
作者
Huang, Andong [1 ,2 ]
Zhong, Zheng [2 ,3 ]
Guo, Yongxin [2 ,3 ]
Wu, Wen [1 ]
机构
[1] Nanjing Univ Sci & Technol, Nanjing, Jiangsu, Peoples R China
[2] Natl Univ Singapore, Singapore, Singapore
[3] Natl Univ Singapore, Suzhou Res Inst, Suzhou, Peoples R China
关键词
GaN HEMTs; Large signal model; Thermal; Trapping; Artificial neural network; Overdetermined System;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a large signal model for AlGaN/GaN HEMTs is proposed which accounts for the thermal and trapping effects. Polynomials and overdetermined system is introduced to better address the complex thermal effect. The extraction is simple and fast compared with empirical models, since only solving overdetermined linear equations is required for the extraction of Ids. The extracted trapping and thermal related nonlinear coefficients are then represented by artificial neural network. Finally, a large signal model is constructed in Advanced Design System, and good agreements have been observed between the measured and simulated S-parameters, bias current, Pout, Gain and PAE under both 50Ohm and optimal load, which further validates the proposed model.
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页数:3
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