Transient self-heating effects in multifinger AlGaN/GaN HEMTs, with metal airbridges

被引:10
|
作者
Kuzmik, J.
Bychikhin, S.
Lossy, R.
Wuerfl, H. J.
Poisson, M.-A. di Forte
Teyssier, J.-P.
Gaquiere, C.
Pogany, D.
机构
[1] Vienna Univ Technol, Inst Solid State Elect, A-1040 Vienna, Austria
[2] Ferdinand Braun Inst Hoechstfrequenztech, D-12489 Berlin, Germany
[3] Alcatel Thales III V Lab, TIGER, F-91404 Orsay, France
[4] Univ Limoges, CNRS, IRCOM, F-19100 Brive, France
[5] IEMN III V Lab, TIGER, F-59652 Villeneuve Dascq, France
[6] Slovak Acad Sci, Inst Elect Engn, Bratislava 84239, Slovakia
关键词
AlGaN/GaN HEMT; selfheating; thermal characterization;
D O I
10.1016/j.sse.2007.04.001
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermal behavior of a multifinger AlGaN/GaN/s,apphire HEMT with a metal aithridge connecting five source contacts is investigated in the transient state using optical and electrical methods and using a 2D thermal model. The gate layout consists of eight fingers, each having 50 mu m width/0.3 mu m length, the pitch is 35 mu m and the thickness of the electroplated airbridge is 7 mu m. The device drain contact was pulsed by 10 mu s long 10 V pulses, corresponding to similar to 11.9 W/mm dissipating power density. The electrical characterization method shows that at the end of the pulse the temperature increase in the HEMT channel is similar to 185 K while the transient interferometric mapping (ITM) optical method indicates that the airbridge structure serves also as a cooler removing approximately 10% of the heat energy. Surface temperature maps are constructed by using the TIM for a time window of 2-6 mu s. An asymmetry in the temperature profiles was observed, e.g. the source contact was colder by similar to 25% than the drain contact at t = 6 mu s. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:969 / 974
页数:6
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