Test Submicron Integrated Circuit for Wideband RF Short-Distance Locator with Noise Modulation

被引：0
|
作者：
Cherepanov, Anton A. [1 ,2 ]
Lys, Vasiliy D. [1 ]
机构：
[1] SibIS Ltd, Novosibirsk, Russia
[2] NSTU, Novosibirsk, Russia
来源：
2016 17TH INTERNATIONAL CONFERENCE OF YOUNG SPECIALISTS ON MICRO/NANOTECHNOLOGIES AND ELECTRON DEVICES (EDM) | 2016年
关键词：
radiolocation; wideband RF short-distance locator; Integrated Circuit; RF oscillator; RF frequency divider; noise modulation;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Test submicron application specific Integrated Circuit (IC) for wideband RF short-distance locator is described. IC has been developed and manufactured using 130 nm silicon CMOS technology. Results of test IC elements measurements are presented, including RF oscillator 10 GHz, frequency divider by 32 (10 GHz to 312.5 MHz), noise generator and custom RF pads.
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页码：205 / 209
页数：5
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