Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response

被引：6

作者：

Di Sarro, James P. ^{[1
]}

Rosenbaum, Elyse ^{[1
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA

来源：

IEEE ELECTRON DEVICE LETTERS | 2009年 / 30卷 / 02期

关键词：

Electrostatic discharge (ESD); silicon-controlled rectifier (SCR); transmission line pulsing (TLP);

D O I：

10.1109/LED.2008.2009361

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.

引用

页码：168 / 170

页数：3

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