Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response

被引：6
|
作者：
Di Sarro, James P. [1 ]
Rosenbaum, Elyse [1 ]
机构：
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
来源：
IEEE ELECTRON DEVICE LETTERS | 2009年 / 30卷 / 02期
关键词：
Electrostatic discharge (ESD); silicon-controlled rectifier (SCR); transmission line pulsing (TLP);
D O I：
10.1109/LED.2008.2009361
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.
引用
收藏
页码：168 / 170
页数：3
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