Simulation Research on Workshop Control Strategy in Semiconductor Wafer Probe Area

被引:0
|
作者
Zhang Tie-Zhu [1 ]
Wang Yue-Peng [1 ]
机构
[1] Harbin Univ Sci & Technol, Econ & Management Sch, Harbin 150080, Heilongjiang, Peoples R China
关键词
Semiconductor wafer probe area; EM-plant; UML; Workshop control strategy;
D O I
10.1109/CCCM.2008.320
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In view of semiconductor wafer probe area's workshop management and control problem, with the thought of object-oriented, a behavior model of probing workshop is set up in terms of the figuration of UML. Paper puts forward an integrated workshop control strategy considered three factors; wafer releasing speed, dispatching rule and buffer capacity. It uses the SimTalk brought by EM-plant to transform behavior model directly into simulation model. By analyzing the experimental result of simulation model, the influence of the wafer releasing speed, machine dispatching and buffer capacity upon probe performance indicators such as month output, production cycle and quantity of work in process are got. It supplies the decision maker with evidence.
引用
收藏
页码:224 / +
页数:2
相关论文
共 50 条
  • [1] A new compound priority control strategy in semiconductor wafer fabrication
    Wang, ZT
    Qiao, F
    Wu, QD
    2005 IEEE NETWORKING, SENSING AND CONTROL PROCEEDINGS, 2005, : 80 - 83
  • [2] Simulation experimental investigation on job release control in semiconductor wafer fabrication
    Qi, Chao
    Sivakumar, Appa Iyer
    Gershwin, Stanley B.
    PROCEEDINGS OF THE 2007 WINTER SIMULATION CONFERENCE, VOLS 1-5, 2007, : 1716 - 1725
  • [3] Parameter optimization for wafer probe simulation
    Liu, Y
    Desbiens, D
    Luk, T
    Irving, S
    THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICRO-ELECTRONICS AND MICRO-SYSTEMS, 2005, : 156 - 161
  • [4] Research on Motion Control and Wafer-Centering Algorithm of Wafer-Handling Robot in Semiconductor Manufacturing
    Han, Bing-Yuan
    Zhao, Bin
    Sun, Ruo-Huai
    SENSORS, 2023, 23 (20)
  • [5] Interactive scheduler for a wafer probe centre in semiconductor manufacturing
    Natl Tsing Hua Univ, Hsinchu, Taiwan
    Int J Prod Res, 7 (1883-1900):
  • [6] An interactive scheduler for a wafer probe centre in semiconductor manufacturing
    Huang, SC
    Lin, JT
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 1998, 36 (07) : 1883 - 1900
  • [7] Simulation of test wafer consumption in a semiconductor facility
    Foster, B
    Meyersdorf, D
    Padillo, JM
    Brenner, R
    ASMC 98 PROCEEDINGS - 1998 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP: THEME - SEMICONDUCTOR MANUFACTURING: MEETING THE CHALLENGES OF THE GLOBAL MARKETPLACE, 1998, : 298 - 302
  • [8] Research on rescheduling for a semiconductor wafer fabrication facility
    Qiao, F
    Li, L
    Wu, QD
    Proceedings of the International Conference on Mechanical Engineering and Mechanics 2005, Vols 1 and 2, 2005, : 1639 - 1643
  • [9] Dynamic WIP control for semiconductor wafer fabrication
    Hu, Hong-Tao
    Jiang, Zhi-Bin
    Zhang, Huai
    Jisuanji Jicheng Zhizao Xitong/Computer Integrated Manufacturing Systems, CIMS, 2008, 14 (09): : 1759 - 1765
  • [10] Improved simple simulation models for semiconductor wafer factories
    Rose, Oliver
    PROCEEDINGS OF THE 2007 WINTER SIMULATION CONFERENCE, VOLS 1-5, 2007, : 1687 - 1691