SIZE-DEPENDENT MODEL FOR THIN FILM THERMAL CONDUCTIVITY

被引：0

作者：

McGaughey, Alan J. H. ^{[1
]}

Sellan, Daniel P. ^{[2
]}

Landry, Eric S. ^{[3
]}

Amon, Cristina H. ^{[2
]}

机构：

[1] Carnegie Mellon Univ, Dept Mech Engn, Pittsburgh, PA 15213 USA

[2] Univ Toronto, Dept Mech & Ind Engn, Toronto, ON M5S 3G8, Canada

[3] Lytron Inc, Woburn, MA 01801 USA

来源：

PROCEEDINGS OF THE ASME/JSME 8TH THERMAL ENGINEERING JOINT CONFERENCE 2011, VOL 3 | 2011年

基金：

加拿大自然科学与工程研究理事会;

关键词：

SCATTERING;

D O I：

暂无

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

We present a closed-form classical model for the size dependence of thin film thermal conductivity. The model predictions are compared to Stillinger-Weber silicon thin film thermal conductivities (in-plane and cross-plane directions) calculated using phonon properties obtained from lattice dynamics calculations. By including the frequency dependence of the phonon-phonon relaxation times, the model is able to capture the approach to the bulk thermal conductivity better than models based on a single relaxation time.

引用

页码：91 / +

页数：2

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