Standing wave approach in the theory of X-ray magnetic reflectivity

被引:7
|
作者
Andreeva, M. A. [1 ]
Baulin, R. A. [1 ]
Repchenko, Yu. L. [2 ]
机构
[1] Moscow MV Lomonosov State Univ, Fac Phys, Moscow 119991, Russia
[2] Kurchatov Inst, Natl Res Ctr, Pl Kurchatova 1, Moscow 123182, Russia
关键词
X-ray standing waves; ellipsometry; X-ray magnetic reflectometry; CIRCULAR-DICHROISM; ANGULAR-DEPENDENCE; FARADAY-ROTATION; ORBITAL MOMENT; SCATTERING; MULTILAYERS; POLARIZATION; SPIN; FE; CO;
D O I
10.1107/S1600577518018398
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An extension of the exact X-ray resonant magnetic reflectivity theory has been developed, taking into account the small value of the magnetic terms in the X-ray susceptibility tensor. It is shown that squared standing waves (fourth power of the total electric field) determine the output of the magnetic addition to the total reflectivity from a magnetic multilayer. The obtained generalized kinematical approach essentially speeds up the calculation of the asymmetry ratio in the magnetic reflectivity. The developed approach easily explains the peculiarities of the angular dependence of the reflectivity with the rotated polarization (such as the peak at the critical angle of the total external reflection). The revealed dependence of the magnetic part of the total reflectivity on the squared standing waves means that the selection of the reflectivity with the rotated polarization ensures higher sensitivity to the depth profiles of magnetization than the secondary radiation at the specular reflection condition.
引用
收藏
页码:483 / 496
页数:14
相关论文
共 50 条
  • [41] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    A. M. Afanas’ev
    M. A. Chuev
    R. M. Imamov
    É. M. Pashaev
    S. N. Yakunin
    J. Horvat
    [J]. Journal of Experimental and Theoretical Physics Letters, 2001, 74 : 498 - 501
  • [42] X-ray diffraction and X-ray standing-wave study of the lead stearate film structure
    A. E. Blagov
    Yu. A. Dyakova
    M. V. Kovalchuk
    V. G. Kohn
    M. A. Marchenkova
    Yu. V. Pisarevskiy
    P. A. Prosekov
    [J]. Crystallography Reports, 2016, 61 : 362 - 370
  • [43] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    Afanas'ev, AM
    Chuev, MA
    Imamov, RM
    Pashaev, ÉM
    Yakunin, SN
    Horvat, J
    [J]. JETP LETTERS, 2001, 74 (10) : 498 - 501
  • [44] X-ray reflectivity studies on glass transition of free standing polystyrene thin films
    T. Miyazaki
    R. Inoue
    K. Nishida
    T. Kanaya
    [J]. The European Physical Journal Special Topics, 2007, 141 : 203 - 206
  • [45] X-ray reflectivity studies on glass transition of free standing polystyrene thin films
    Miyazaki, T.
    Inoue, R.
    Nishida, K.
    Kanaya, T.
    [J]. EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 2007, 141 (1): : 203 - 206
  • [46] Theory and applications of x-ray standing waves in real crystals
    Vartanyants, IA
    Kovalchuk, MV
    [J]. REPORTS ON PROGRESS IN PHYSICS, 2001, 64 (09) : 1009 - 1084
  • [47] ANALYSIS OF NEUTRON AND X-RAY REFLECTIVITY DATA .1. THEORY
    HAMLEY, IW
    PEDERSEN, JS
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 29 - 35
  • [48] Reflectivity test of X-ray mirrors for deep X-ray lithography
    Nazmov, V.
    Reznikova, E.
    Last, A.
    Boerner, M.
    Mohr, J.
    [J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2008, 14 (9-11): : 1299 - 1303
  • [49] Reflectivity test of X-ray mirrors for deep X-ray lithography
    V. Nazmov
    E. Reznikova
    A. Last
    M. Boerner
    J. Mohr
    [J]. Microsystem Technologies, 2008, 14 : 1299 - 1303
  • [50] Ge delta layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements
    Beck, U
    Yang, P
    Metzger, TH
    Peisl, J
    Falta, J
    Materlik, G
    Rupp, T
    Baumgartner, H
    Eisele, I
    Patel, JR
    [J]. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 403 - 410