ANALYSIS OF NEUTRON AND X-RAY REFLECTIVITY DATA .1. THEORY

被引：72
|
作者：
HAMLEY, IW
PEDERSEN, JS
机构：
[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455
[2] RISO NATL LAB,DEPT SOLID STATE PHYS,DK-4000 ROSKILDE,DENMARK
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1994年 / 27卷 / pt 1期
关键词：
D O I：
10.1107/S0021889893006260
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.
引用
收藏
页码：29 / 35
页数：7
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