ANALYSIS OF NEUTRON AND X-RAY REFLECTIVITY DATA .1. THEORY

被引：72
|
作者：
HAMLEY, IW
PEDERSEN, JS
机构：
[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455
[2] RISO NATL LAB,DEPT SOLID STATE PHYS,DK-4000 ROSKILDE,DENMARK
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1994年 / 27卷 / pt 1期
关键词：
D O I：
10.1107/S0021889893006260
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.
引用
收藏
页码：29 / 35
页数：7
相关论文
共 50 条
  • [21] ON THE THEORY OF REFLECTIVITY BY AN X-RAY MULTILAYER MIRROR
    KOHN, VG
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1995, 187 (01): : 61 - 70
  • [22] Accuracy in x-ray reflectivity analysis
    Tiilikainen, J.
    Tilli, J-M
    Bosund, V.
    Mattila, M.
    Hakkarainen, T.
    Sormunen, J.
    Lipsanen, H.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (23) : 7497 - 7501
  • [23] Wavelet analysis of X-ray spectroscopic data .1. The method
    Bury, P
    Ennode, N
    Petit, JM
    Bendjoya, P
    Martinez, JP
    Pinna, H
    Jaud, J
    Balladore, JL
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 383 (2-3): : 572 - 588
  • [24] Simultaneous Parameter Optimization of X-ray and Neutron Reflectivity Data Using Genetic Algorithms
    Singh, Surendra
    Basu, Saibal
    DAE SOLID STATE PHYSICS SYMPOSIUM 2015, 2016, 1731
  • [25] X-ray and neutron reflectivity measurements for characterizing thin gold film x-ray reflectors
    Lodha, GS
    Basu, S
    Gupta, A
    Pandita, S
    Nandedkar, RV
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 163 (02): : 415 - 424
  • [26] Characterization of a layer stack by wavelet analysis on x-ray reflectivity data
    Smigiel, E
    Cornet, A
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (15) : 1757 - 1763
  • [27] Development of a Bayesian inference method for the analysis of X-ray reflectivity data
    Machida, Atsushi
    Watanabe, Takeshi
    Mizumaki, Masaichiro
    Nagata, Kenji
    Okada, Masato
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2024, 63 (01)
  • [28] X-Ray and neutron reflectivity investigations of Co/Cu multilayers
    Joyce, DE
    Campbell, SI
    Pugh, PRT
    Grundy, PJ
    PHYSICA B, 1998, 248 : 152 - 156
  • [29] FLUORESCENT X-RAY ANALYSIS .1.
    GOHSHI, Y
    JAPAN ANALYST, 1970, 19 (11): : 1582 - &
  • [30] Determination of the molecular arrangement from neutron or X-ray reflectivity
    Politsch, E
    Cevc, G
    PHYSICA B, 2000, 276 (276): : 390 - 391
12345