共 50 条
- [41] Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complementary techniques for high resolution surface investigations [J]. Surface Modification Technologies XV, 2002, : 109 - 118
- [43] SURFACE-MORPHOLOGY OF GAAS(110) BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 1394 - 1396
- [44] Study of oxidized Cu(110) surface using noncontact atomic force microscopy [J]. SURFACE SCIENCE, 2008, 602 (13) : 2175 - 2182
- [45] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY FOR MICROTRIBOLOGY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (02): : 291 - 292
- [46] THEORETICAL SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY STUDY OF GRAPHITE INCLUDING TIP SURFACE INTERACTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 313 - 318
- [47] THE INFLUENCE OF TERPENES ON HUMAN STRATUM CORNEUM BY FLUORESCENCE MICROSCOPY, ATOMIC FORCE MICROSCOPY AND SCANNING ELECTRON MICROSCOPY [J]. ACTA POLONIAE PHARMACEUTICA, 2017, 74 (04): : 1063 - 1070