Scattering by linear defects in graphene: a tight-binding approach

被引：14

作者：

Rodrigues, J. N. B. ^{[1
,2
]}

Peres, N. M. R. ^{[3
,4
]}

Lopes dos Santos, J. M. B. ^{[1
,2
]}

机构：

[1] Univ Porto, CFP, Fac Ciencias, P-4169007 Oporto, Portugal

[2] Univ Porto, Dept Fis & Astron, Fac Ciencias, P-4169007 Oporto, Portugal

[3] Univ Minho, Dept Phys, P-4710057 Braga, Portugal

[4] Univ Minho, CFUM, P-4710057 Braga, Portugal

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2013年 / 25卷 / 07期

关键词：

GRAIN-BOUNDARIES; TRANSPORT;

D O I：

10.1088/0953-8984/25/7/075303

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We develop an analytical scattering formalism for computing the transmittance through periodic defect lines within the tight-binding model of graphene. We first illustrate the method with a relatively simple case, the pentagon-only defect line. Afterwards, more complex defect lines are treated, namely the zz(558) and the zz(5757) ones. The formalism developed uses only simple tight-binding concepts, reducing the problem to matrix manipulations which can be easily worked out by any computational algebraic calculator.

引用

页数：20

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