Scattering by linear defects in graphene: a tight-binding approach

被引:14
|
作者
Rodrigues, J. N. B. [1 ,2 ]
Peres, N. M. R. [3 ,4 ]
Lopes dos Santos, J. M. B. [1 ,2 ]
机构
[1] Univ Porto, CFP, Fac Ciencias, P-4169007 Oporto, Portugal
[2] Univ Porto, Dept Fis & Astron, Fac Ciencias, P-4169007 Oporto, Portugal
[3] Univ Minho, Dept Phys, P-4710057 Braga, Portugal
[4] Univ Minho, CFUM, P-4710057 Braga, Portugal
关键词
GRAIN-BOUNDARIES; TRANSPORT;
D O I
10.1088/0953-8984/25/7/075303
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We develop an analytical scattering formalism for computing the transmittance through periodic defect lines within the tight-binding model of graphene. We first illustrate the method with a relatively simple case, the pentagon-only defect line. Afterwards, more complex defect lines are treated, namely the zz(558) and the zz(5757) ones. The formalism developed uses only simple tight-binding concepts, reducing the problem to matrix manipulations which can be easily worked out by any computational algebraic calculator.
引用
收藏
页数:20
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