Crystal characterization of spherical silicon solar cell by X-ray diffraction

被引:3
|
作者
Omae, Satoshi
Minemoto, Takashi
Murozono, Mikio
Takakura, Hideyuki
Hamakawa, Yoshihiro
机构
[1] Ritsumeikan Univ, Fac Sci & Engn, Shiga 5258577, Japan
[2] Clean Ventrue 21 Co, Hirakata, Osaka 5730128, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 5A期
关键词
spherical silicon; solar cell; crystal grain; crystallinity; X-ray pole figure; X-ray rocking curve;
D O I
10.1143/JJAP.45.3933
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the crystal quality of spherical Si solar cells by X-ray diffraction. A Si sphere with a diameter of 1 mm was fabricated by a dropping method. X-ray pole figure measurements confirmed that the Si sphere includes twin crystals. The spherical Si solar cells were fabricated using Si spheres. The spherical Si solar cells consisting of almost the same number of crystal grains exhibited various performance characteristics, because no clear correlation between the X-ray pole figure measurements indicating the grain number and the solar cell performance characteristics was confirmed. An X-ray rocking curve and a Dash etching method for the spherical Si solar cells indicated that the short-circuit current density and open-circuit voltage of the solar cells depend on the crystallinity of intragrains.
引用
收藏
页码:3933 / 3937
页数:5
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