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High-performance black phosphorus top-gate ferroelectric transistor for nonvolatile memory applications
被引:6
|作者:
Lee, Young Tack
[1
]
Hwang, Do Kyung
[1
]
Choi, Won Kook
[2
]
机构:
[1] Korea Inst Sci & Technol, Ctr Optoelect Mat & Devices, Postsilicon Semicond Inst, Seoul 02792, South Korea
[2] Korea Inst Sci & Technol, Mat & Life Sci Res Div, Seoul 02792, South Korea
关键词:
Black Phosphorus (BP);
Ferroelectric field-effect transistor (FeFET);
Nonvolatile memory;
FIELD-EFFECT TRANSISTORS;
P-N DIODE;
LAYER;
METAL;
GAP;
HETEROJUNCTION;
JUNCTIONS;
CONTACTS;
MOBILITY;
D O I:
10.3938/jkps.69.1347
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
Two-dimensional (2D) van der Waals (vdW) atomic crystals have been extensively studied and significant progress has been made. The newest 2D vdW material, called black phosphorus (BP), has attracted considerable attention due to its unique physical properties, such as its being a singlecomponent material like graphene, and its having a high mobility and direct band gap. Here, we report on a high-performance BP nanosheet based ferroelectric field effect transistor (FeFET) with a poly(vinylidenefluoride-trifluoroethylene) top-gate insulator for a nonvolatile memory application. The BP FeFETs show the highest linear hole mobility of 563 cm(2)/Vs and a clear memory window of more than 15 V. For more advanced nonvolatile memory circuit applications, two different types of resistive-load and complementary ferroelectric memory inverters were implemented, which showed distinct memory on/off switching characteristics.
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页码:1347 / 1351
页数:5
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