Investigation of Flip-Flop Effects in a Linear Analog Comparator-With-Hysteresis Circuit

被引：6
|
作者：
Roche, Nicolas J-H. [1 ,2 ,3 ]
Buchner, S. P. [1 ]
Roig, F. [4 ]
Dusseau, L. [3 ]
Warner, J. H. [1 ]
Boch, J. [3 ]
McMorrow, D. [1 ]
Saigne, F. [3 ]
Auriel, G. [4 ]
Azais, B. [5 ]
机构：
[1] US Naval Res Lab, Washington, DC 20375 USA
[2] George Washington Univ, Washington, DC 20052 USA
[3] Univ Montpellier 2, IES, CNRS, UMR 5214, F-34095 Montpellier 5, France
[4] Commissariat Energie Atom & Energies Alternat, CEA, F-46500 Gramat, France
[5] DGA, F-92221 Bagneux, France
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2013年 / 60卷 / 04期
关键词：
Bipolar circuits; integrated circuit modeling; single event transient; transient propagation; transient response; SINGLE-EVENT TRANSIENTS; LM124; OPERATIONAL-AMPLIFIER; RADIATION; IMPACT;
D O I：
10.1109/TNS.2013.2258682
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The impact of the positive feedback loop on analog single event transient (ASET) shapes was investigated for a comparator-with-hysteresis circuit. Simulation based on previous developed ASET simulation tool is used to model the impact of the power supply voltage, the input voltage level and the injected energy. Simulation results show that these kinds of circuits are sensitive to flip-flop effects. This phenomenon occurs if the input voltage is in the hysteresis band range. In this case, simulations show that the ASET can latch the output into a non-desired state by changing the state of the circuit on his transfer characteristic curves. Laser experiments were conducted and show that the simulation outputs are in agreement with the experimental collected data.
引用
收藏
页码：2542 / 2549
页数：8
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