Integrated Inductors in HR SOI CMOS technologies: on the economic advantage of SOI technologies for the integration of RF applications

被引:0
|
作者
Gianesello, F. [1 ]
Gloria, D. [1 ]
Raynaud, C. [2 ]
Montusclat, S. [1 ]
Boret, S. [1 ]
Touret, P. [2 ]
机构
[1] STMicroelect, FTM, 850 Ave Jean Monnet, F-38926 Crolles, France
[2] CEA Leti, Grenoble 38000, France
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents high-Q and high-inductance-density on-chip inductors made on High Resistivity (HR) substrate using STMicroelectronics LP 65 nm SOI CMOS technology with 6 copper metal layers. For the first time, on-chip inductor architectures dedicated to HR SOI CMOS technology are reported and benchmarked with current one used in standard RF CMOS technologies. According to the measurement results, proposed 3D HR SOI inductor occupies only 50% of the area of the conventional planar spiral inductor with the same inductance and similar quality factor. By virtue of the small area consumed by those 3D inductor, the size and cost of the radio frequency (RF) chip integrated on HR SOI can be significantly reduced in comparison with standard bulk technology which RF enforces the advantage of SOI technology for RF applications.
引用
收藏
页码:103 / +
页数:2
相关论文
共 50 条
  • [31] High Volume RF/Microwave SOI-CMOS Integrated Circuits
    A. J. Auberton-Herve
    T. Barge
    C. Maleville
    A. Wittkower
    Analog Integrated Circuits and Signal Processing, 2000, 25 : 85 - 91
  • [32] High volume RF/microwave SOI-CMOS integrated circuits
    Auberton-Herve, AJ
    Barge, T
    Maleville, C
    Wittkower, A
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2000, 25 (02) : 85 - 91
  • [33] Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
    Brothers, C
    Pugh, R
    Duggan, P
    Chavez, J
    Schepis, D
    Yee, D
    Wu, S
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2134 - 2139
  • [34] Partially depleted CMOS SOI technology for low power RF applications
    Tinella, C.
    Gianesello, F.
    Gloria, D.
    Raynaud, C.
    Delatte, P.
    Engelstein, A.
    Fournier, J. M.
    Benech, Ph.
    Jomaah, J.
    GAAS 2005: 13TH EUROPEAN GALLIUM ARSENIDE AND OTHER COMPOUND SEMICONDUCTORS APPLICATION SYMPOSIUM, CONFERENCE PROCEEDINGS, 2005, : 101 - 104
  • [35] SOI MATERIALS AND TECHNOLOGIES TOWARDS THREE-DIMENSIONAL INTEGRATION.
    Croset, M.
    Vacuum, 1987, 37 (1-2)
  • [36] CMOS/SOI technologies for low-power and low-voltage circuits
    Pelloie, JL
    Raynaud, C
    Faynot, O
    Grouillet, A
    de Pontcharra, JD
    MICROELECTRONIC ENGINEERING, 1999, 48 (1-4) : 327 - 334
  • [37] Advanced technologies for optimized sub-quarter-micrometer SOI CMOS devices
    Univ of California, Los Angeles, United States
    IEEE Trans Electron Devices, 5 (1092-1098):
  • [38] Advanced technologies for optimized sub-quarter-micrometer SOI CMOS devices
    Hsiao, TC
    Liu, P
    Woo, JCS
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (05) : 1092 - 1098
  • [40] Investigation of on-chip integrated inductors fabricated in SOI-MUMPs for RF MEMS ICs
    Fahimullah Khan
    M. I. Younis
    Analog Integrated Circuits and Signal Processing, 2020, 102 : 585 - 591