Research on High-speed ADC Test and Evaluation System

被引：0

作者：

Zhang, Mingrui ^{[1
]}

Han, Yao ^{[1
]}

Geng, Fei ^{[1
]}

Zhang, Chenghui ^{[1
]}

Duan, Bin ^{[1
]}

机构：

[1] Shandong Univ, Sch Control Sci & Engn, Jinan, Shandong, Peoples R China

来源：

2017 CHINESE AUTOMATION CONGRESS (CAC) | 2017年

基金：

中国国家自然科学基金;

关键词：

ADC test; Dynamic characteristic parameter; FFT; LABVIEW; FPGA;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

With the development of science and technology, the application of data acquisition system is more and more common. Analog-to-digital converter (ADC) is the core part for the data acquisition system to affect the speed and the accuracy. Therefore, the test of ADC performance becomes very important. The ADC test and evaluation system is studied in this paper. Firstly, the basic principle and method for the ADC test and evaluation are described. Then the software and hardware systems are realized, which are respectively based on LABVIEW and FPGA. Finally, the evaluation system is proved by testing the data acquisition system, which is based on the AD7767. Test results show that the proposed system can effectively measure dynamic characteristic parameters of the ADC.

引用

页码：4927 / 4931

页数：5

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