LOCAL MEMORY FOR A HIGH-SPEED DIGITAL TEST SYSTEM

被引：1
|
作者：
BUSH, TS [1 ]
机构：
[1] GENRAD INC,DIV TEST SYST,CONCORD,MA 01742
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1977年 / 26卷 / 03期
关键词：
D O I：
10.1109/TIM.1977.4314539
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：217 / 220
页数：4
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