A diagnosability metric for parametric path delay faults

被引：19
|
作者：
Sivaraman, M [1 ]
Strojwas, AJ [1 ]
机构：
[1] CARNEGIE MELLON UNIV,PITTSBURGH,PA 15213
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510874
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：316 / 322
页数：7
相关论文
共 50 条
  • [21] Memory efficient ATPG for path delay faults
    Long, WN
    Li, ZC
    Yang, SY
    Min, YH
    SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS, 1997, : 326 - 331
  • [22] Implicit grading of multiple path delay faults
    Padmanaban, Saravanan
    Tragoudas, Spyros
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2006, 11 (02) : 346 - 361
  • [23] A complete characterization of path delay faults through stuck-at faults
    Majumder, S
    Bhattacharya, BB
    Agrawal, VD
    Bushnell, ML
    TWELFTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1999, : 492 - 497
  • [24] Test enrichment for path delay faults using multiple sets of target faults
    Pomeranz, I
    Reddy, SM
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS, 2002, : 722 - 729
  • [25] Test enrichment for path delay faults using multiple sets of target faults
    Pomeranz, I
    Reddy, SM
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (01) : 82 - 90
  • [26] A DFT approach for path delay faults in interconnected circuits
    Pomeranz, I
    Reddy, SM
    ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2003, : 72 - 75
  • [27] An efficient method to identify untestable path delay faults
    Shao, Y
    Reddy, SM
    Kajihara, S
    Pomeranz, I
    10TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2001, : 233 - 238
  • [28] Local transformations and robust dependent path delay faults
    Hengster, H
    Sparmann, U
    Becker, B
    Reddy, SM
    INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 347 - 356
  • [29] Classification and identification of nonrobust untestable path delay faults
    Cheng, KT
    Chen, HC
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1996, 15 (08) : 845 - 853
  • [30] A nonenumerative ATPG for functionally sensitizable path delay faults
    Karayiannis, D
    Tragoudas, S
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 440 - 445
12345