An Analytical Expression for Current Gain of an IGBT

被引:0
|
作者
Moon, Jin-Woo [1 ]
Chung, Sang-Koo [2 ,3 ,4 ,5 ,6 ]
机构
[1] Fairchild Semiconductor, Proc Technol Dev Korea, Analog Technol Dev, Puchon, South Korea
[2] Yanbian Univ Sci & Technol, Div Comp Elect & Commun Engn, Yanji, Peoples R China
[3] Tech Univ Berlin, Berlin, Germany
[4] Univ Regensburg, Inst Appl Phys, D-8400 Regensburg, Germany
[5] Ajou Univ, Sch Engn, Suwon, South Korea
[6] Ajou Univ, Grad Sch, Suwon 441749, South Korea
关键词
IGBT; Current Gain; Analytical Expression;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simple analytical expression for a current gain of IGBT is derived in terms of the device parameters as well as a gate length dependent parameter, which allows for the determination of the current components of the device as a function of its gate length. The analytical results are compared with those from simulation results. A good agreement is found.
引用
收藏
页码:401 / 404
页数:4
相关论文
共 50 条
  • [11] Analytical expression for calculating large-signal gain of RF power amplifiers
    Guezzen, Fethi
    Tamoum, Mohammed
    Allam, Rachid
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2018, 60 (08) : 1956 - 1959
  • [12] Analytical Model and Current Gain Enhancement of Polysilicon-Emitter Contact Bipolar Transistors
    Zouari, Abdelaziz
    Ben Arab, Abdel
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (11) : 3214 - 3220
  • [13] The expression correction of transistor current gain and its application in reliability assessment
    Qi Haochun
    Zhang Xiaoling
    Xie Xuesong
    Zhao Li
    Chen Chengju
    Lu Changzhi
    JOURNAL OF SEMICONDUCTORS, 2014, 35 (09)
  • [14] The expression correction of transistor current gain and its application in reliability assessment
    齐浩淳
    张小玲
    谢雪松
    赵利
    陈成菊
    吕长志
    Journal of Semiconductors, 2014, 35 (09) : 75 - 79
  • [15] An improved analytical model of IGBT in forward conduction mode
    Pavlovic, Z
    Manic, I
    Stojadinovic, N
    2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, 2004, : 163 - 166
  • [16] A new analytical IGBT model with improved electrical characteristics
    Sheng, KA
    Finney, SJ
    Williams, BW
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 1999, 14 (01) : 98 - 107
  • [17] Derivation of a simple analytical expression of the gain of pure argon filled CAT proportional counters
    Chaplier, G
    Lemonnier, M
    Megtert, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 440 (02): : 466 - 470
  • [18] Impact of the anode current of an IGBT on the gate voltage
    Bock, B
    Steimel, A
    PESC 04: 2004 IEEE 35TH ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6, CONFERENCE PROCEEDINGS, 2004, : 2930 - 2936
  • [19] A design of IGBT with the hole current bypass structure
    Zhao, Ge
    Wang, Yaohua
    Gao, Mingchao
    Liu, Jiang
    Jin, Rui
    Wen, Jialiang
    Proceedings of the 2016 3rd International Conference on Mechatronics and Information Technology (ICMIT), 2016, 49 : 14 - 17
  • [20] Research on the Measuring System for IGBT Current Distribution
    Ma Xianwei
    Hu Mengyue
    Meng Heli
    Cheng Yangchun
    Zhang Jun
    2018 IEEE INTERNATIONAL CONFERENCE ON HIGH VOLTAGE ENGINEERING AND APPLICATION (ICHVE), 2018,