Embedded two-rail checkers with on-line testing ability

被引：13
|
作者：
Metra, C [1 ]
Favalli, M [1 ]
Ricco, B [1 ]
机构：
[1] UNIV BOLOGNA,DEIS,I-40136 BOLOGNA,ITALY
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510849
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
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收藏
页码：145 / 150
页数：6
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