Electrical tip-sample contact in scanning conductive torsion mode

被引:4
|
作者
Weber, Stefan A. L. [1 ]
Berger, Ruediger [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
关键词
ATOMIC-FORCE MICROSCOPY; PEDOT-PSS FILMS; CHARGE-TRANSPORT; PROBE MICROSCOPY; SOLAR-CELLS; NANOSCALE; POLYMER; THIN; RESONANCE; BLENDS;
D O I
10.1063/1.4802725
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the nature of the mechanical and the electrical tip-sample contact in scanning conductive torsion mode microscopy (SCTMM). Experiments on the soft conducting polymer blend of poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) demonstrated that the tip-sample force and thus the danger of tip-induced sample damage can be minimized. Using current-voltage spectroscopy, we found a space-charge limited conduction behavior with no indication of a tunneling barrier. Spectroscopy and imaging experiments showed that SCTMM allows for a gentler tip-sample contact compared to conventional conductive scanning force microscopy. A gentle and well-defined contact is a prerequisite for reproducible scanning probe based conductivity measurements, in particular on soft organic materials. (C) 2013 AIP Publishing LLC [http://dx.doi.org/10.1063/1.4802725]
引用
收藏
页数:5
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