Techniques for Improving System-in-Package Integration and Electrical Performance

被引:0
|
作者
Huang, Shaowu [1 ]
Delacruz, Javi [1 ]
机构
[1] Xperi Corp, 3025 Orchard Pkwy, San Jose, CA 95134 USA
关键词
SIP; RF; EMI; Signal Integrity; Power Integrity; Interconnect; BVA;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we use bond-via-arr ayn4 (BVA) wirebonds to achieve compact vertical integration and improve the electrical performance of system-in-package (SiP) modules. Two improvements are presented. First, BVA wirebonds are utilized to integrate passive or active components vertically with other components. This significantly reduces the horizontal footprint of the entire SiP. In terms of electrical performance, this vertical integration provides much lower parasitic inductance than conventional 2D horizontal integration designs because of shorter interconnections. For example, the proposed technology can significantly reduce power delivery network (PDN) impedance compared to a conventional design. Second, we propose BVA wirebond wires as an electromagnetic interference (EMI) shield between different domains within the SiP. This provides a lower cost solution for EMI shielding, particularly when regions within a package need to be shielded.
引用
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页数:6
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