共 50 条
- [21] Computational investigation of the phase stability and the electronic properties for Gd-doped HfO2APPLIED PHYSICS LETTERS, 2014, 104 (20)Wang, L. G.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China CALTECH, Pasadena, CA 91125 USA Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R ChinaXiong, Y.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R ChinaXiao, W.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R ChinaCheng, L.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R ChinaDu, J.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R ChinaTu, H.论文数: 0 引用数: 0 h-index: 0机构: Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China论文数: 引用数: h-index:机构:
- [22] Origin of Ferroelectricity in Epitaxial Si-Doped HfO2 FilmsACS APPLIED MATERIALS & INTERFACES, 2019, 11 (04) : 4139 - 4144Li, Tao论文数: 0 引用数: 0 h-index: 0机构: Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R China Dongguan Univ Technol, Sch Elect Engn & Intelligentizat, Dongguan 523808, Peoples R China Nanchang Univ, Sch Mat Sci & Engn, Nanchang 330031, Jiangxi, Peoples R China Hong Kong Polytech Univ, Dept Appl Phys, Hung Hom, Kowloon, Hong Kong, Peoples R China Hong Kong Polytech Univ, Mat Res Ctr, Hung Hom, Kowloon, Hong Kong, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaYe, Mao论文数: 0 引用数: 0 h-index: 0机构: South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaSun, Zhenzhong论文数: 0 引用数: 0 h-index: 0机构: Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaZhang, Nian论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaZhang, Wei论文数: 0 引用数: 0 h-index: 0机构: Dongguan Univ Technol, Sch Elect Engn & Intelligentizat, Dongguan 523808, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R China论文数: 引用数: h-index:机构:Xie, Chunxiao论文数: 0 引用数: 0 h-index: 0机构: Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaChen, Lang论文数: 0 引用数: 0 h-index: 0机构: South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaWang, Yu论文数: 0 引用数: 0 h-index: 0机构: Nanchang Univ, Sch Mat Sci & Engn, Nanchang 330031, Jiangxi, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaKe, Shanming论文数: 0 引用数: 0 h-index: 0机构: Nanchang Univ, Sch Mat Sci & Engn, Nanchang 330031, Jiangxi, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R ChinaHuang, Haitao论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Polytech Univ, Dept Appl Phys, Hung Hom, Kowloon, Hong Kong, Peoples R China Hong Kong Polytech Univ, Mat Res Ctr, Hung Hom, Kowloon, Hong Kong, Peoples R China Dongguan Univ Technol, Sch Mech Engn, Dongguan 523808, Peoples R China
- [23] Comparison of n-type Gd2O3 and Gd-doped HfO2JOURNAL OF PHYSICS-CONDENSED MATTER, 2009, 21 (04)Losovyj, Ya B.论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Louisiana State Univ, Ctr Adv Microstruct & Devices, Baton Rouge, LA 70806 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USAWooten, David论文数: 0 引用数: 0 h-index: 0机构: AF Inst Technol, Wright Patterson AFB, OH 45433 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USASantana, Juan Colon论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USAAn, Joonhee Michael论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USABelashchenko, K. D.论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USALozova, N.论文数: 0 引用数: 0 h-index: 0机构: Louisiana State Univ, Ctr Adv Microstruct & Devices, Baton Rouge, LA 70806 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USAPetrosky, J.论文数: 0 引用数: 0 h-index: 0机构: AF Inst Technol, Wright Patterson AFB, OH 45433 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USASokolov, A.论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USATang, Jinke论文数: 0 引用数: 0 h-index: 0机构: Univ Wyoming, Dept Phys & Astron, Laramie, WY 82071 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USAWang, Wendong论文数: 0 引用数: 0 h-index: 0机构: Univ Wyoming, Dept Phys & Astron, Laramie, WY 82071 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USAArulsamy, Navamoney论文数: 0 引用数: 0 h-index: 0机构: Univ Wyoming, Dept Chem, Laramie, WY 82071 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USADowben, P. A.论文数: 0 引用数: 0 h-index: 0机构: Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
- [24] Ferroelectricity in Lu doped HfO2 layersAPPLIED PHYSICS LETTERS, 2017, 111 (14)Tromm, T. C. U.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyZhang, J.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanySchubert, J.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyLuysberg, M.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Ernst Ruska Ctr 1, D-52428 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyZander, W.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyHan, Q.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyMeuffels, P.论文数: 0 引用数: 0 h-index: 0机构: JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI 7, D-52428 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyMeertens, D.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Ernst Ruska Ctr 1, D-52428 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyGlass, S.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyBernardy, P.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, GermanyMantl, S.论文数: 0 引用数: 0 h-index: 0机构: Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany JARA, Fundamentals Future Informat Technol, D-52425 Julich, Germany Forschungszentrum Julich, Peter Grunberg Inst PGI IT 9, D-52428 Julich, Germany
- [25] Microstructural evolution and ferroelectricity in HfO2 filmsMICROSTRUCTURES, 2022, 2 (02):Zhao, Dou论文数: 0 引用数: 0 h-index: 0机构: Univ Sydney, Sch Aerosp Mech & Mechatron Engn, City Rd, Sydney, NSW 2006, Australia Univ Sydney, Sch Aerosp Mech & Mechatron Engn, City Rd, Sydney, NSW 2006, AustraliaChen, Zibin论文数: 0 引用数: 0 h-index: 0机构: Hong Kong Polytech Univ, Dept Ind & Syst Engn, Hong Kong, Peoples R China Univ Sydney, Sch Aerosp Mech & Mechatron Engn, City Rd, Sydney, NSW 2006, AustraliaLiao, Xiaozhou论文数: 0 引用数: 0 h-index: 0机构: Univ Sydney, Sch Aerosp Mech & Mechatron Engn, City Rd, Sydney, NSW 2006, Australia Univ Sydney, Sch Aerosp Mech & Mechatron Engn, City Rd, Sydney, NSW 2006, Australia
- [26] Stability of monoclinic phase in pure and Gd-doped HfO2: a hyperfine interaction studyHyperfine Interactions, 2019, 240Debashis Banerjee论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)Chandi Charan Dey论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)Sk. Wasim Raja论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)Ram Sewak论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)S. V. Thakare论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)Raghunath Acharya论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)Pradeep Kumar Pujari论文数: 0 引用数: 0 h-index: 0机构: Variable Energy Cyclotron Centre,Radiochemistry Division (BARC)
- [27] Ferroelectricity in Nd Doped HfO2 Films Grown by Molecular Beam EpitaxyKuei Suan Jen Hsueh Pao/Journal of the Chinese Ceramic Society, 2023, 51 (12): : 3039 - 3045Liu Y.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingJiao P.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingMao W.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingYang J.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingZheng N.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingWang P.论文数: 0 引用数: 0 h-index: 0机构: Department of Physics, Univesity of Warwick, Coventry Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingWu D.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, NanjingNie Y.论文数: 0 引用数: 0 h-index: 0机构: Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing Jiangsu Key Laboratory of Artificial Functional Materials, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Nanjing
- [28] Effects of Al doping concentration and top electrode on the ferroelectricity of Al-doped HfO2 thin filmsAIP ADVANCES, 2024, 14 (01)Feng, Li论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaLi, Yu-Chun论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaHuang, Teng论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaLu, Hong-Liang论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaZhang, David Wei论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China
- [29] Ferroelectricity and Antiferroelectricity of Doped Thin HfO2-Based FilmsADVANCED MATERIALS, 2015, 27 (11) : 1811 - 1831Park, Min Hyuk论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaLee, Young Hwan论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaKim, Han Joon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaKim, Yu Jin论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaMoon, Taehwan论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaDo Kim, Keum论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaMueller, Johannes论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer IPMS CNT, D-01109 Dresden, Germany Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaKersch, Alfred论文数: 0 引用数: 0 h-index: 0机构: Univ Appl Sci Munich, D-80335 Munich, Germany Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea论文数: 引用数: h-index:机构:Mikolajick, Thomas论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Dresden, NaMLab gGmbH, D-01187 Dresden, Germany Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South KoreaHwang, Cheol Seong论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea Seoul Natl Univ, Coll Engn, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea
- [30] Effects of charge and dipole on flatband voltage in an MOS device with a Gd-doped HfO2 dielectricChinese Physics B, 2013, 22 (11) : 589 - 592论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构: