Carrier-to-noise ratio enhancement of super-resolution near-field structure disks by Ag nanostructure

The recording and retrieval characteristics of super-resolution near-field structure disks have been evaluated before and after the fabrication of a Ag-nanostructured film on the top dielectric layer, using a 405 nm wavelength laser and a 0.65 numerical aperture lens system. The carrier-to-noise ratio for 100 nm mark signals is significantly improved by applying the Ag-nanostructured film. The underlying mechanism for the enhancement depends on the top dielectric layer thickness. A simulation based on Mie theory shows good agreement with the measured reflectance spectrum for the Ag-nanostructured film. (c) 2006 American Institute of Physics.