Carrier-to-noise ratio enhancement of super-resolution near-field structure disks by Ag nanostructure

被引：8
|
作者：
Arai, T
Kurihara, K
Nakano, T
Tominaga, J
Rockstuhl, C
机构：
[1] AIST, CAN FOR, Tsukuba, Ibaraki 3058562, Japan
[2] Univ Jena, Inst Solid State Theory & Opt, D-07743 Jena, Germany
来源：
APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 05期
关键词：
D O I：
10.1063/1.2172017
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The recording and retrieval characteristics of super-resolution near-field structure disks have been evaluated before and after the fabrication of a Ag-nanostructured film on the top dielectric layer, using a 405 nm wavelength laser and a 0.65 numerical aperture lens system. The carrier-to-noise ratio for 100 nm mark signals is significantly improved by applying the Ag-nanostructured film. The underlying mechanism for the enhancement depends on the top dielectric layer thickness. A simulation based on Mie theory shows good agreement with the measured reflectance spectrum for the Ag-nanostructured film. (c) 2006 American Institute of Physics.
引用
收藏
页码：1 / 3
页数：3
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