Comment on "Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors"

被引：7

作者：

Deng, Hui-Xiong ^{[1
]}

Wei, Su-Huai ^{[2
]}

机构：

[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China

[2] Beijing Computat Sci Res Ctr, Beijing 100193, Peoples R China

来源：

PHYSICAL REVIEW LETTERS | 2018年 / 120卷 / 03期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1103/PhysRevLett.120.039601

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

[No abstract available]

引用

页数：2

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