Comment on "Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors"

被引：7
|
作者：
Deng, Hui-Xiong [1 ]
Wei, Su-Huai [2 ]
机构：
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
[2] Beijing Computat Sci Res Ctr, Beijing 100193, Peoples R China
来源：
PHYSICAL REVIEW LETTERS | 2018年 / 120卷 / 03期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1103/PhysRevLett.120.039601
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
[No abstract available]
引用
收藏
页数：2
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