Analysis of peri-implant bone defects by using cone beam computed tomography (CBCT): an integrative review

被引:9
|
作者
Costa, J. A. [1 ]
Mendes, J. M. [2 ]
Salazar, F. [2 ]
Pacheco, J. J. [2 ]
Rompante, P. [2 ]
Camara, M. I. [1 ]
机构
[1] CESPU, Univ Inst Hlth Sci IUCS, Med & Oral Surg Dept, P-4585116 Gandra, Portugal
[2] CESPU, Univ Inst Hlth Sci IUCS, UNIPRO Oral Pathol & Rehabil Res Unit, P-4585116 Gandra, Portugal
关键词
CBCT; Cone-beam computed tomography; Dental implant; Peri-implant; Bone loss; PERIAPICAL RADIOGRAPHY; BUCCAL BONE; ACCURACY;
D O I
10.1007/s11282-023-00683-w
中图分类号
R78 [口腔科学];
学科分类号
1003 ;
摘要
The objective of this work was to perform an integrative review of the inspection of peri-implant bone defects using cone beam computed tomography (CBCT). An electronic search was performed in the PubMed database using the following scientific terms: CBCT or Cone Beam computed tomography; dental implant; peri-implant; bone loss; defects. The survey identified 267 studies, of which 18 were considered relevant to this study. These studies provided important data taking into account the accuracy of cone beam computed tomography in the detection and measurement of peri-implant bone defects such as fenestrations, dehiscence and intraosseous circumferential defects. The effectiveness of CBCT in aiding in geometric bone calculations and in the diagnosis of peri-implant defects was influenced by factors such as artefacts, defect size, bone wall thickness, implant material, adjustment of acquisition parameters and observer experience. A not insignificant number of studies compared intraoral radiography to CBCT in the detection of peri-implant bone loss. CBCT was clearly superior to intraoral radiography in the detection of all peri-implant bone defects, except for defects located in the interproximal zone. In general, studies have shown that peri-implant bone measurements adjacent to the implant surface can be correctly determined, as well as the diagnosis of peri-implant bone defects with an average discrepancy of less than 1 mm from the actual measurement of the defect.
引用
收藏
页码:455 / 466
页数:12
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