Demonstration of a silicon gated field emitter array based low frequency Colpitts oscillator at 400 °C

被引:5
|
作者
Bhattacharya, Ranajoy [1 ]
Hay, Robert [1 ]
Cannon, Mason [1 ]
Karaulac, Nedeljko [2 ]
Rughoobur, Girish [2 ]
Akinwande, Akintunde Ibitayo [2 ]
Browning, Jim [1 ]
机构
[1] Boise State Univ, Dept Elect & Comp Engn, 1375 W Univ Dr, Boise, ID 83725 USA
[2] MIT, Dept Elect Engn & Comp Sci, 77 Massachusetts Ave, Cambridge, MA 02139 USA
来源
关键词
ELECTRON-EMISSION;
D O I
10.1116/6.0002272
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon gated field emitter arrays have been used as a vacuum transistor to demonstrate a 152 kHz Colpitts oscillator. The transfer and output characteristics of the 1000 x 1000 silicon arrays were measured using a collector placed & AP; 1 mm away with a gate voltage up to 40 V and a collector voltage up to 200 V. The data were used to establish an LTspice transistor model based on a field emission tip model and a collector current model that fit the characteristics. Then, the LTspice model was used to design a low frequency Colpitts oscillator. Furthermore, experiments were carried out to successfully demonstrate the oscillation. Oscillation frequency was 152 kHz with a peak to peak voltage of 25 V for a tip to ground series resistance value of 10 k Omega at 50 V on the gate and 210 V on the collector. Further, the oscillator was also tested at 50, 100, 200, 300, and 400 degrees C. It was observed that frequency shifts for each temperature which is due to the change in the overall capacitance of the test setup. This type of device could be used as a temperature sensor in harsh environments.
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页数:7
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