Two-dimensional analysis on the magnetic field adjusted electrical behaviors in composite semiconductor structures

被引:8
|
作者
Zhao, Luke [1 ]
Deng, Tian [1 ]
Jin, Feng [1 ,2 ]
机构
[1] Xi An Jiao Tong Univ, Sch Aerosp, State Key Lab Strength & Vibrat Mech Struct, Xian 710049, Shaanxi, Peoples R China
[2] Xi An Jiao Tong Univ, Sch Aerosp, MOE Key Lab Multifunct Mat & Struct, Xian 710049, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
Two-dimensional analysis; Composite magneto-electro-semiconductor; structures; Fourier series; Differential quadrature method; Structural design; Electrical properties; INDUCED POTENTIAL BARRIERS; ELECTROMECHANICAL FIELDS; PN JUNCTION; NANOWIRE; FIBER;
D O I
10.1016/j.compstruct.2023.116732
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
To explore the exact electric properties and reveal the intrinsic interaction mechanisms among multi-fields in composite magneto-electric-semiconductor structures, two-dimensional analyses are performed based on the coupled field theory. Expanding the basic physical quantities to Fourier series along the length, the governing equations are simplified. And then, the discrete solutions are derived by utilizing differential quadrature method. As applications, three composite structures are designed via considering different poling directions. Respectively, the extension, piecewise deformation and bending are realized. Before analysis, the convergence and correctness of adopted method are discussed systematically. In numerical calculation, the effect of material proportion on the perturbation carrier density is investigated. It is found the variation rule of perturbation carrier density is controlled by material proportion and deformation form simultaneously. Importantly, there are optimal material proportion ranges producing the carriers, nevertheless, the ranges are different for three structures. Additionally, two-dimensional distributions of perturbation carrier density, electric field, electric displacement and polariza-tion are discussed. Along the thickness, the field quantities are symmetric for extension and piecewise defor-mation, but is antisymmetric for bending. Specially, in the structure with piecewise deformation, the potential barriers are realized. This work could be the guidance designing magneto-electric devices.
引用
收藏
页数:18
相关论文
共 50 条
  • [31] Analysis of the magnetic field, force, and torque for two-dimensional Halbach cylinders
    Bjork, R.
    Smith, A.
    Bahl, C. R. H.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2010, 322 (01) : 133 - 141
  • [32] Advanced model of laminated magnetic cores for two-dimensional field analysis
    Bottauscio, O
    Chiampi, M
    Chiarabaglio, D
    IEEE TRANSACTIONS ON MAGNETICS, 2000, 36 (03) : 561 - 573
  • [33] Two-dimensional Coulomb interactions in a magnetic field
    Xia, JB
    REVIEWS IN MATHEMATICAL PHYSICS, 1999, 11 (03) : 361 - 382
  • [34] Magnetic two-dimensional field effect transistor
    Raymond, A.
    Chaubet, C.
    Chenaud, B.
    Delgard, A.
    Bisotto, I.
    Harmand, J. C.
    Zawadzki, W.
    APPLIED PHYSICS LETTERS, 2017, 111 (23)
  • [35] Two-dimensional trion in a magnetic field revisited
    Aleksandrov, I. A.
    Kudlis, A.
    Shelykh, I. A.
    PHYSICAL REVIEW B, 2024, 109 (03)
  • [36] Two-dimensional lattice with an imaginary magnetic field
    Ozawa, Tomoki
    Hayata, Tomoya
    PHYSICAL REVIEW B, 2024, 109 (08)
  • [37] TWO-DIMENSIONAL POLARON IN A MAGNETIC-FIELD
    WU, XG
    PEETERS, FM
    DEVREESE, JT
    PHYSICAL REVIEW B, 1985, 32 (12) : 7964 - 7969
  • [38] NEW SEMICONDUCTOR SUPER-LATTICES AND TWO-DIMENSIONAL STRUCTURES
    PETHIG, R
    ELECTRONICS AND POWER, 1982, 28 (09): : 571 - 572
  • [39] A semiclassical approach to the electron gas in two-dimensional semiconductor structures
    Quang, DN
    Tung, NH
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1998, 207 (01): : 111 - 123
  • [40] Using two-dimensional structures to model filamentation in semiconductor devices
    Hower, P
    Pendharkar, S
    Steinhoff, R
    Brodsky, J
    Devore, J
    Grose, W
    ISPSD'01: PROCEEDINGS OF THE 13TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2001, : 385 - 388