Deep core level hard X-ray photoelectron spectroscopy for catalyst characterization

被引:0
|
作者
Longo, Filippo [1 ,2 ,3 ]
Nikolic, Marin [1 ,2 ]
Borgschulte, Andreas [1 ,2 ]
机构
[1] Empa Swiss Fed Labs Mat Sci & Technol, Lab Adv Analyt Technol, Dubendorf, Switzerland
[2] Univ Zurich, Dept Chem, Zurich, Switzerland
[3] Empa Swiss Fed Labs Mat Sci & Technol, Lab Adv Analyt Technol, Uberlandstr 129, CH-8600 Dubendorf, Switzerland
关键词
Auger parameter; chemical state analysis; HAXPES; heterogeneous catalysts; METAL-ORGANIC FRAMEWORKS; AUGER-PARAMETER; MOLECULAR-SIEVES; CHEMICAL-STATES; GAMMA-ALUMINA; XPS; SITES; SELECTIVITY; ZEOLITES; SILICA;
D O I
10.1002/sia.7267
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Heterogeneous catalysts are the crucial element for many catalytic processes. In most of the cases, the pivotal structure consists of catalytic metals/alloy particles supported by oxides. Knowledge of the interaction between metal and oxide is central to understand the structure-performance relationship of such systems. X-ray photoelectron spectroscopy provides access to the chemical-physical properties of metal and oxide interface as well as polarization effects. The results are usually derived from changes of the measured binding energies based on initial state analysis. We propose to extend the analysis using photoelectron as well as Auger transition to include final state effects (Wagner/Hohlneichner plots). This gives additional information on the specific chemical neighborhood of the excited atom. Three archetypal systems are investigated by hard X-ray photoelectron spectroscopy (HAXPES) to introduce two approaches to this analysis for the most common support elements Al and Si.
引用
收藏
页码:249 / 258
页数:10
相关论文
共 50 条
  • [1] Deep layers analysis by hard x-ray photoelectron spectroscopy
    Kobayashi, Keisuke
    Journal of the Vacuum Society of Japan, 2013, 56 (09) : 365 - 376
  • [2] X-ray photoelectron spectroscopy in the hard X-ray regime
    Fadley, C. S.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2007, 156 : XXXVI - XXXVI
  • [3] Hard x-ray photoelectron spectroscopy at a soft x-ray source: Present and future perspectives of hard x-ray photoelectron spectroscopy at BESSY II
    Félix, Roberto
    Gorgoi, Mihaela
    Wilks, Regan G.
    Bär, Marcus
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2021, 39 (06):
  • [4] Hard x-ray photoelectron spectroscopy at a soft x-ray source: Present and future perspectives of hard x-ray photoelectron spectroscopy at BESSY II
    Felix, Roberto
    Gorgoi, Mihaela
    Wilks, Regan G.
    Baer, Marcus
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2021, 39 (06):
  • [5] CORE LEVEL X-RAY PHOTOELECTRON-SPECTROSCOPY OF AUXGAY ALLOYS
    JAYNE, DT
    FATEMI, NS
    WEIZER, VG
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2802 - 2805
  • [6] Hard X-ray photoelectron and X-ray absorption spectroscopy characterization of oxidized surfaces of iron sulfides
    Mikhlin, Yuri
    Tomashevich, Yevgeny
    Vorobyev, Sergey
    Saikova, Svetlana
    Romanchenko, Alexander
    Felix, Roberto
    APPLIED SURFACE SCIENCE, 2016, 387 : 796 - 804
  • [7] Hard X-ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces
    Romanyuk, Oleksandr
    Supplie, Oliver
    Paszuk, Agnieszka
    Stoeckmann, Jan Philipp
    Wilks, Regan George
    Bombsch, Jakob
    Hartmann, Claudia
    Garcia-Diez, Raul
    Ueda, Shigenori
    Bartos, Igor
    Gordeev, Ivan
    Houdkova, Jana
    Kleinschmidt, Peter
    Baer, Marcus
    Jiricek, Petr
    Hannappel, Thomas
    SURFACE AND INTERFACE ANALYSIS, 2020, 52 (12) : 933 - 938
  • [8] Recent applications of hard x-ray photoelectron spectroscopy
    Weiland, Conan
    Rumaiz, Abdul K.
    Pianetta, Piero
    Woicik, Joseph C.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2016, 34 (03):
  • [9] Probing deeper by hard x-ray photoelectron spectroscopy
    Risterucci, P.
    Renault, O.
    Martinez, E.
    Detlefs, B.
    Delaye, V.
    Zegenhagen, J.
    Gaumer, C.
    Grenet, G.
    Tougaard, S.
    APPLIED PHYSICS LETTERS, 2014, 104 (05)
  • [10] The Application of X-Ray Photoelectron Spectroscopy on Refining Catalyst
    Qiu Li-mei
    Xu Guang-tong
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2015, 35 (12) : 3514 - 3518