Broadband Coaxial S-Parameter Measurements for Cryogenic Quantum Technologies

被引:4
|
作者
Shin, Sang-Hee [1 ]
Stanley, Manoj [1 ]
Skinner, James [1 ]
de Graaf, Sebastian E. [1 ]
Ridler, Nick M. [1 ]
机构
[1] Natl Phys Lab, Teddington TW11 0LW, England
关键词
Low temperature measurement; microwave calibration; S-parameters; superconducting quantum; thru-reflect-line (TRL) calibration;
D O I
10.1109/TMTT.2023.3322909
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Development of RF and microwave metrology capabilities at cryogenic temperatures is critical for the development of high-performance microwave devices to facilitate commercialization of cryogenic quantum technologies. This article presents a broadband microwave S-parameter calibration scheme suitable for cryogenic environments operating at temperatures down to tens of milli-kelvin (mK). The technique is based on a weighted multi-line thru-reflect-line (TRL) calibration approach and is demonstrated using coaxial air line calibration standards. One-and two-port microwave devices commonly used in cryogenic quantum computing applications, a cryogenic 50 Omega matched load and a cryogenic 6 dB attenuator, were measured. The measured results at mK temperatures indicate that when combined with calibration standards of appropriate electrical length, the weighted multi-line TRL calibration scheme allows broadband frequency coverage compared to conventional TRL calibration schemes utilizing a single line standard. The mechanical and electrical properties of the line standards at mK temperatures were investigated and discussed. These findings establish the feasibility of utilizing multiple off-the-shelf coaxial air lines to enhance the frequency range of calibrations at mK temperatures.
引用
收藏
页码:2193 / 2201
页数:9
相关论文
共 50 条
  • [1] Characterization of Coaxial Adapters for S-parameter Measurements
    Hoffmann, Johannes Paul
    Leuchtman, Pascal
    Kretz, Adjan
    Ruefenacht, Juerg
    Vahldieck, Ruediger
    [J]. 2008 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, 2008, : 401 - +
  • [2] Accurate broadband parameter extraction methodology for S-parameter measurements
    Balachandran, J
    Brebels, S
    Carchon, G
    De Raedt, W
    Nauwelaers, B
    Beyne, E
    [J]. SIGNAL PROPAGATION ON INTERCONNECTS, PROCEEDINGS, 2005, : 57 - 60
  • [3] Traceable S-parameter measurements up to 90 GHz in 1.35 mm coaxial
    Stokes, Daniel
    Gellersen, Frauke
    Allal, Djamel
    Skinner, James
    Phung, Gia Ngoc
    Kuhlmann, Karsten
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2023, 34 (06)
  • [4] On peculiarities of S-parameter measurements
    Rolain, Yves
    Van Moer, Wendy
    Jargon, Jeffrey A.
    DeGroot, Donald C.
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (05) : 1967 - 1972
  • [5] S-PARAMETER CHARACTERIZATION OF COAXIAL TO MICROSTRIP TRANSITION
    SOUZA, JR
    TALBOYS, EC
    [J]. IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION, 1982, 129 (01) : 37 - 40
  • [6] Broadband noise parameter and S-parameter measurement technique
    Schmatz, ML
    Baechtold, W
    [J]. 1997 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS I-III: HIGH FREQUENCIES IN HIGH PLACES, 1997, : 1443 - 1446
  • [7] Performing S-parameter measurements
    Sundberg, G
    [J]. MICROWAVES & RF, 2001, 40 (06) : 99 - 100
  • [8] Methods of Connector S-Parameter Extraction Depending on Broadband Measurements of Symmetrical Structures
    Mueller, Simon
    Diewald, Andreas R.
    [J]. 2015 LOUGHBOROUGH ANTENNAS & PROPAGATION CONFERENCE (LAPC), 2015,
  • [9] S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties
    Hinojosa, J
    Faucon, L
    Queffelec, P
    Huret, F
    [J]. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2001, 30 (01) : 65 - 69
  • [10] S-parameter Estimation Algorithm for Coaxial Ring Resonator
    Pan, Jingnan
    Gao, Xu
    Sui, Chunchun
    Fan, Jun
    Yang, Zhiping
    Wu, Ken
    [J]. 2016 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2016, : 775 - 779