A Spatially Distributed Single Photon Avalanche Diode Verilog-A Compact Model

被引：0

作者：

Rink, Sven ^{[1
,2
]}

Kammerer, Jean-Baptiste ^{[1
]}

Quenette, Vincent ^{[2
]}

Uhring, Wilfried ^{[1
]}

Gouget, Gilles ^{[2
]}

Manouvrier, Jean-Robert ^{[2
]}

Lallement, Christophe ^{[1
]}

机构：

[1] Ctr Natl Rech Sci CNRS, ICube Lab, F-67200 Strasbourg, France

[2] STMicroelectron, F-38920 Crolles, France

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2024年 / 71卷 / 01期

关键词：

Avalanche breakdown; compact model; experimentally validated model; imaging; industry; 4.0; loop modeling; single photon avalanche diode (SPAD); transient characterization; Verilog-A;

D O I：

10.1109/TED.2023.3311423

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single photon avalanche diodes (SPADs) are crucial for Industry 4.0 advancements, especially in the design of LIght Detection And Ranging (LIDAR) sensors. A compact model is needed to accurately describe their transient behavior. This article presents a lumped model approach that divides the device into different regions. The model accurately emulates the behavior of reach-through SPAD photodiodes by dividing them into high electric field multiplication and low electric field absorption regions. The absorption region can be further subdivided to create multiple possible photon impact points, resulting in precise jitter modeling. This approach enables adaptable and unified SPAD modeling for different avalanche diode architectures. Experimental data confirm the accuracy of the model, and the characterization technique developed highlights the stochastic nature of the device.

引用

页码：331 / 336

页数：6

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