Point field emission electron source with a magnetically focused electron beam

被引:0
|
作者
Urbanski, Pawel [1 ]
Szyszka, Piotr [1 ]
Bialas, Marcin [1 ]
Grzebyk, Tomasz [1 ]
机构
[1] Wroclaw Univ Sci & Technol, Fac Elect Photon & Microsyst, 11-17 Janiszewski St, PL-50372 Wroclaw, Poland
关键词
Magnetic focusing; Electrostatic focusing; Field electron source; MEMS;
D O I
10.1016/j.ultramic.2023.113911
中图分类号
TH742 [显微镜];
学科分类号
摘要
This paper presents a field emitter in the form of a silicon tip covered with a layer of carbon nanotubes. The emitted beam is focused with a set of two electrostatic lenses and - which is novelty in such structures - with a magnetic field. The presented approach gave very promising results. The field emitter was able to provide a high emission current (about 50 mu A) and a beam with a small and homogeneous spot. Such electron sources are necessary components of many miniature MEMS and nanoelectronics devices. The presented source is dedicated especially for the use in currently developed MEMS X-ray sources and MEMS electron microscopes.
引用
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页数:8
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