Design of experiment base scenario analysis in discrete event simulation of multi-path manufacturing system

被引:0
|
作者
Krstovski, Saso [1 ]
Ali, Ahad [1 ]
机构
[1] Lawrence Technol Univ, Leon Linton Dept Mech Engn, 21000 West Ten Mile Rd, Southfield, MI 48075 USA
关键词
discrete event simulation; statistical analysis; design of experiment-manufacturing system; equipment cycle time; ECT; mean time before failure; MTBF; mean time to repair; MTTR; design of experiment; DOE;
D O I
10.1504/IJSTM.2023.135067
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
Analysis of a complex multi-path manufacturing system requires a simulation model. After model construction, it requires unique equipment inputs. Inputs consist of equipment cycle time (ECT), mean time before failure (MTBF), mean time to repair (MTTR). These inputs should be distributions that incorporate the randomness of the system. Typically simulation models are developed based on some underlying assumptions and inputs from past system performance indexes. This research proposes a new method of transforming a current simulation model to reflect actual system behaviour at various time-periods accurately. Key model system inputs were incorporated into a design of experiment (DOE) to extract levels that reflected system behaviour on particular dates. Comparing model input vs. actual manufacturing system performance confirmed simulation model validation.
引用
收藏
页码:335 / 342
页数:9
相关论文
共 50 条
  • [41] Matrix formulation for design and analysis of discrete event manufacturing systems with shared resources
    Lewis, F.L.
    Huang, H.-H.
    Pastravanu, O.C.
    Gurel, A.
    Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, 1994, 2 : 1700 - 1705
  • [42] Reconfigurability in cellular manufacturing systems: a design model and multi-scenario analysis
    Bortolini, Marco
    Galizia, Francesco Gabriele
    Mora, Cristina
    Pilati, Francesco
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2019, 104 (9-12): : 4387 - 4397
  • [43] Reconfigurability in cellular manufacturing systems: a design model and multi-scenario analysis
    Marco Bortolini
    Francesco Gabriele Galizia
    Cristina Mora
    Francesco Pilati
    The International Journal of Advanced Manufacturing Technology, 2019, 104 : 4387 - 4397
  • [44] A Combined Discrete Event Simulation and Factorial Design Experiment for the Scheduling Problem in a Hybrid Flow Shop
    Istokovic, David
    Lucin, Ivana
    Pesevic, Ariana
    Vlatkovic, Maja
    TEHNICKI GLASNIK-TECHNICAL JOURNAL, 2024, 18 (03): : 418 - 424
  • [45] A Discrete Event Simulation and Evaluation Framework for Multi UAV System Maintenance Processes
    Dietrich, Thomas
    Krug, Silvia
    Zimmermann, Armin
    2017 IEEE INTERNATIONAL SYMPOSIUM ON SYSTEMS ENGINEERING (ISSE 2017), 2017, : 190 - 195
  • [46] Design of Compact Multi-Path Thomson Scattering Diagnostic with Signal Delay System in Heliotron J
    Qiu, Dechuan
    Minami, Takashi
    Nishide, Takuya
    Miyoshi, Masahiro
    Yamanaka, Yuta
    Kado, Shinichiro
    Ohshima, Shinsuke
    Nagasaki, Kazunobu
    Okada, Hiroyuki
    Kobayashi, Shinji
    Mizuuchi, Tohru
    Konoshima, Shigeru
    Yasuhara, Ryo
    PLASMA AND FUSION RESEARCH, 2020, 15
  • [47] Design and analysis of an outpatient orthopaedic clinic performance with discrete event simulation and design of experiments
    Baril, Chantal
    Gascon, Viviane
    Cartier, Stephanie
    COMPUTERS & INDUSTRIAL ENGINEERING, 2014, 78 : 285 - 298
  • [48] THE DESIGN AND DEVELOPMENT OF A DISCRETE EVENT SIMULATION SYSTEM TO SUPPORT VIRTUAL INDUSTRY ACTIVITIES
    Ribeiro, Luiz P. G.
    Ferreira, Joao C. E.
    E-BUSINESS AND VIRTUAL ENTERPRISES: MANAGING BUSINESS-TO-BUSINESS COOPERATION, 2001, 56 : 341 - 350
  • [49] SYSTEM-DESIGN AND EVALUATION USING DISCRETE-EVENT SIMULATION WITH AI
    CLYMER, JR
    EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 1995, 84 (01) : 213 - 225
  • [50] Advances in Parallel Discrete Event Simulation for Electronic System-Level Design
    Chen, Weiwei
    Han, Xu
    Chang, Che-Wei
    Doemer, Rainer
    IEEE DESIGN & TEST, 2013, 30 (01) : 45 - 54