Deep Industrial Image Anomaly Detection: A Survey

被引:43
|
作者
Liu, Jiaqi [1 ]
Xie, Guoyang [1 ,2 ]
Wang, Jinbao [1 ]
Li, Shangnian [1 ]
Wang, Chengjie [3 ]
Zheng, Feng [1 ]
Jin, Yaochu [2 ,4 ]
机构
[1] Southern Univ Sci & Technol, Res Inst Trustworthy Autonomous Syst, Shenzhen 518055, Peoples R China
[2] Univ Surrey, NICE Grp, Guildford GU2 7YX, England
[3] Tencent, Youtu Lab, Shanghai 200233, Peoples R China
[4] Bielefeld Univ, NICE Grp, D-33619 Bielefeld, Germany
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
Image anomaly detection; defect detection; industrial manufacturing; deep learning; computer vision; DEFECT DETECTION; SALIENCY DETECTION; SEGMENTATION; LOCALIZATION; TRANSFORMER; NETWORK; SAMPLES; MODEL;
D O I
10.1007/s11633-023-1459-z
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The recent rapid development of deep learning has laid a milestone in industrial image anomaly detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the promising setting from industrial manufacturing and review the current IAD approaches under our proposed setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.
引用
收藏
页码:104 / 135
页数:32
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