2.2 W/mm at 94 GHz in AlN/GaN/AlN High-Electron-Mobility Transistors on SiC

被引:2
|
作者
Hickman, Austin [1 ]
Chaudhuri, Reet [1 ]
Li, Lei [1 ]
Nomoto, Kazuki [1 ]
Moser, Neil [2 ]
Elliott, Michael [2 ]
Guidry, Matthew [3 ]
Shinohara, Keisuke [4 ]
Hwang, James C. M. [5 ]
Xing, Huili Grace [1 ,5 ,6 ]
Jena, Debdeep [1 ,5 ,6 ]
机构
[1] Cornell Univ, Elect & Comp Engn, Ithaca, NY 14853 USA
[2] Wright Patterson AFB, Dayton, OH 45433 USA
[3] UC Santa Barbara, Santa Barbara, CA 93106 USA
[4] Teledyne Sci & Imaging, Thousand Oaks, CA 91360 USA
[5] Cornell Univ, Mat Sci & Engn, Ithaca, NY 14853 USA
[6] Cornell Univ, Kavli Inst, Ithaca, NY 14853 USA
关键词
AlN; GaN; millimeter waves; PERFORMANCE; VOLTAGE;
D O I
10.1002/pssa.202200774
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Aluminum nitride (AlN) offers novel potential for electronic integration and performance benefits for high-power, millimeter-wave amplification. Herein, load-pull power performance at 30 and 94 GHz for AlN/GaN/AlN high-electron-mobility transistors (HEMTs) on silicon carbide (SiC) is reported. When tuned for peak power-added efficiency (PAE), the reported AlN/GaN/AlN HEMT shows PAE of 25% and 15%, with associated output power (Pout) of 2.5 and 1.7 W mm(-1), at 30 and 94 GHz, respectively. At 94 GHz, the maximum Pout generated is 2.2 W mm(-1), with associated PAE of 13%.
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页数:4
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