4H-Silicon Carbide as an Acoustic Material for MEMS

被引:3
|
作者
Long, Yaoyao [1 ]
Liu, Zhenming [1 ]
Ayazi, Farrokh [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30308 USA
关键词
4H-SiC; 4H-SiCOI; 4H-SiC high-aspect-ratio (HAR) deep reactive ion etching (DRIE); acoustic materials; elastic anisotropy; elastic constants; frequency split; HAR DRIE; high Q-factor; mechanical materials; mechanoacoustic material; microelectromechanical systems (MEMS); MEMS resonators; silicon carbide (SiC); silicon carbide-on-insulator (SiCOI); smart cut; temperature coefficient of frequency (TCF); temperature coefficient of quality factor (TCQ); transverse isotropy; SILICON-CARBIDE; TEMPERATURE-DEPENDENCE; ELASTIC-CONSTANTS; FRACTURE; 4H; STRENGTH; POLYTYPE; MODULUS; SENSORS;
D O I
10.1109/TUFFC.2023.3282920
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
This article discusses the potential of 4H-silicon carbide (SiC) as a superior acoustic material formicroelectromechanical systems (MEMS), particularly forhigh-performance resonator and extreme environmentsapplications. Through a comparison of the crystallinestructure along with the mechanical, acoustic, electrical,and thermal properties of 4H with respect to otherSiC polytypes and silicon, it is shown that 4H-SiCpossesses salient properties for MEMS applications,including its transverse isotropy and small phononscattering dissipation. The utility and implementationof bonded SiC on insulator (4H-SiCOI) substrates asan emerging MEMS technology platform are presented.Additionally, this article reports on the temperature-dependent mechanical properties of 4H-SiC, includingthe temperature coefficient of frequency (TCF) andquality factor (Q-factor) for Lam & eacute; mode resonators.Finally, the 4H-SiC MEMS fabrication including its deepreactive ion etching is discussed. This article providesvaluable insights into the potential of 4H-SiC as amechanoacoustic material and provides a foundation forfuture research in the field.
引用
收藏
页码:1189 / 1200
页数:12
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