共 50 条
- [47] WANNIER-STARK EFFECT - NATURE OF NEGATIVE DIFFERENTIAL RESISTANCE IN 4H-SILICON CARBIDE AND 6H-SILICON CARBIDE PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1991, 17 (23): : 38 - 42
- [48] High temperature performance mapping and failure analysis of 4H-silicon carbide MOSFETS SPACE TECHNOLOGY AND APPLICATIONS INTERNATIONAL FORUM, PTS 1-3: 1ST CONFERENCE ON FUTURE SCIENCE & EARTH SCIENCE MISSIONS; 1ST CONFERENCE ON SYNERGISTIC POWER & PROPULSION SYSTEMS TECHNOLOGY; 1ST CONFERENCE ON APPLICATIONS OF THERMOPHYSICS IN MICROGRAVITY; 2ND CONFERENCE ON COMMERCIAL DEVELOPMENT OF SPACE; - 2ND CONFERENCE ON NEXT GENERATION LAUNCH SYSTEMS; 14TH SYMPOSIUM ON SPACE NUCLEAR POWER AND PROPULSION, 1997, (387): : 843 - 850
- [49] SEM visibility of stacking faults in 4H-silicon carbide epitaxial and implanted layers SILICON CARBIDE AND RELATED MATERIALS - 2002, 2002, 433-4 : 937 - 940
- [50] A comparison of MESFETs on different 4H-Silicon carbide semi-insulating substrates SILICON CARBIDE AND RELATED MATERIALS - 2002, 2002, 433-4 : 737 - 739