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DNA interstrand crosslink repair by XPF-ERCC1 homologue confers ultraviolet resistance in Neurospora crassa
被引:0
|作者:
Tsukada, Kotaro
[1
]
Hatakeyama, Shin
[1
]
Tanaka, Shuuitsu
[1
]
机构:
[1] Saitama Univ, Grad Sch Sci & Engn, Div Life Sci, Lab Genet, Shimo Ohkubo 255 Sakura Ward, Saitama, Saitama 3388570, Japan
关键词:
DNA repair;
Photoreactivation;
Nucleotide excision repair;
Interstrand crosslink repair;
XPF-ERCC1;
Neurospora crassa;
NUCLEOTIDE EXCISION-REPAIR;
UV-SENSITIVE MUTANT;
MUTAGEN SENSITIVITY;
GENE;
ENDONUCLEASE;
ERCC1;
PHOTOREACTIVATION;
INVOLVEMENT;
DEFICIENT;
EPISTASIS;
D O I:
10.1016/j.fgb.2022.103752
中图分类号:
Q3 [遗传学];
学科分类号:
071007 ;
090102 ;
摘要:
Ultraviolet (UV) light is a mutagen that causes DNA damage. Some UV-sensitive Neurospora crassa strains have been reported to exhibit a partial photoreactivation defect (PPD) phenotype, and the possible cause of this has been unknown for more than half a century. In this study, in the process of elucidating the possible causes of a PPD phenotype, we discovered that the XPF homologue MUS-38 is involved in repairing the UV-induced DNA interstrand crosslink (ICL) in N. crassa. Furthermore, the sensitivity of the Delta mus-38 and Delta mus-44 strains to ICL agents was significantly higher than that of other nucleotide excision repair (NER)-related gene knockout (KO) strains, indicating that the MUS-38/MUS-44 complex is involved in an NER-independent ICL repair mechanism. Based on reports concerning the mammalian homologues XPF and ERCC1 we obtained separation-of-function mutants defective only in NER in mus-38 and mus-44. Additionally, the photoreactivation ability of these mu-tants was significantly higher than that of the KO strains. These results indicate that the PPD phenotype is caused by a defect in the repair-ability of ICL induced by UV and that an NER-independent ICL repair by MUS-38 and MUS-44 confers resistance to UV in N. crassa.
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页数:7
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