On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper explores the feasibility of adapting the indirect test strategy to implement on-line RF performance monitoring. After stating the principle of the proposed solution, we consider the fundamental requirements necessary to adapt the indirect test strategy. Finally, a proof of concept is established through a practical case of study by monitoring the power level delivered by the RF transmitter of a wireless microcontroller: hardware measurement results demonstrate the potential of this approach.