On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

被引：0

作者：

Badawi, H. El ^{[1
,2
]}

Azais, F. ^{[1
]}

Bernard, S. ^{[1
]}

Comte, M. ^{[1
]}

Kerzerho, V. ^{[1
]}

Lefevre, F. ^{[2
]}

机构：

[1] Univ Montpellier, CNRS, LIRMM, 161 rue Ada, F-34095 Montpellier, France

[2] NXP Semicond, 2 Esplanade Anton Phillips, F-14000 Caen, France

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2023年 / 39卷 / 02期

关键词：

RF integrated circuits; Reliability; On-line monitoring; Indirect test; Machine-learning; ANALOG;

D O I：

10.1007/s10836-023-06058-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper explores the feasibility of adapting the indirect test strategy to implement on-line RF performance monitoring. After stating the principle of the proposed solution, we consider the fundamental requirements necessary to adapt the indirect test strategy. Finally, a proof of concept is established through a practical case of study by monitoring the power level delivered by the RF transmitter of a wireless microcontroller: hardware measurement results demonstrate the potential of this approach.

引用

页码：155 / 170

页数：16

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