On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

被引：0
|
作者：
Badawi, H. El [1 ,2 ]
Azais, F. [1 ]
Bernard, S. [1 ]
Comte, M. [1 ]
Kerzerho, V. [1 ]
Lefevre, F. [2 ]
机构：
[1] Univ Montpellier, CNRS, LIRMM, 161 rue Ada, F-34095 Montpellier, France
[2] NXP Semicond, 2 Esplanade Anton Phillips, F-14000 Caen, France
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2023年 / 39卷 / 02期
关键词：
RF integrated circuits; Reliability; On-line monitoring; Indirect test; Machine-learning; ANALOG;
D O I：
10.1007/s10836-023-06058-7
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper explores the feasibility of adapting the indirect test strategy to implement on-line RF performance monitoring. After stating the principle of the proposed solution, we consider the fundamental requirements necessary to adapt the indirect test strategy. Finally, a proof of concept is established through a practical case of study by monitoring the power level delivered by the RF transmitter of a wireless microcontroller: hardware measurement results demonstrate the potential of this approach.
引用
收藏
页码：155 / 170
页数：16
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