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- [41] Evaluating the Impact of Environment and Physical Variability on the ION Current of 20nm FinFET Devices 2014 24TH INTERNATIONAL WORKSHOP ON POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION (PATMOS), 2014,
- [42] Novel Low Power Full Adder Cells in 180nm CMOS Technology ICIEA: 2009 4TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, VOLS 1-6, 2009, : 425 - 428
- [43] BOX Breakdown: a novel defect mode in a 14nm SOI FinFET technology 2018 29TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2018, : 70 - 73
- [44] Impact of Statistical Variability and Charge Trapping on 14 nm SOI FinFET SRAM Cell Stability 2013 PROCEEDINGS OF THE EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC), 2013, : 234 - 237
- [45] Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology 2021 21ST EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2021, : 46 - 52
- [46] Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes 2023 IFIP/IEEE 31ST INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION, VLSI-SOC, 2023, : 171 - 176
- [47] Presenting a Synchronous - Asynchronous Standard Cell Library Based on 7nm FinFET Technology 2016 28TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (ICM 2016), 2016, : 325 - 328
- [48] Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology 2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
- [49] Local Variation-Aware Transistor Design through Comprehensive Analysis of Various Vdd/Temperatures Using Sub-7nm Advanced FinFET Technology 2020 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, 2020,