Mixed stitching interferometry with correction from one-dimensional profile measurements for high-precision X-ray mirrors

被引:4
|
作者
Wu, Qiaoyu [1 ,2 ,3 ]
Huang, Qiushi [1 ,2 ,3 ]
Yu, Jun [1 ,2 ,3 ]
Zhu, Yifan [1 ,2 ,3 ]
Gu, Weichen [1 ,2 ,3 ]
Sheng, Pengfeng [1 ,2 ,3 ]
He, Yumei [4 ]
Luo, Hongxin [4 ]
Zhang, Zhong [1 ,2 ,3 ]
Wang, Zhanshan [1 ,2 ,3 ]
机构
[1] Tongji Univ, Inst Precis Opt Engn IPOE, Sch Phys Sci & Engn, Key Lab Adv Microstruct Mat,Minist Educ, Shanghai 200092, Peoples R China
[2] Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China
[3] Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China
[4] Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai 201210, Peoples R China
基金
中国国家自然科学基金;
关键词
METROLOGY;
D O I
10.1364/OE.486829
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This work presents a mixed stitching interferometry method with correction from one-dimensional profile measurements. This method can correct the error of stitching angles among different subapertures using the relatively accurate one-dimensional profiles of the mirror, e.g., provided by the contact profilometer. The measurement accuracy is simulated and analyzed. The repeatability error is decreased by averaging multiple measurements of the one-dimensional profile and using multiple profiles at different measurement positions. Finally, the measurement result of an elliptical mirror is presented and compared with the global algorithm-based stitching, and the error of the original profiles is reduced to one-third. This result shows that this method can effectively suppress the accumulation of stitching angle errors in classic global algorithm -based stitching. The accuracy of this method can be further improved by using high-precision one-dimensional profile measurements such as the nanometer optical component measuring machine (NOM).(c) 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
引用
收藏
页码:16330 / 16347
页数:18
相关论文
共 50 条
  • [41] X-ray scattering on one-dimensional disordered structures
    Cherepanova, S. V.
    JOURNAL OF STRUCTURAL CHEMISTRY, 2012, 53 : S109 - S132
  • [42] One-dimensional surface profile retrieval from grazing incidence images under coherent X-ray illumination
    Suvorov, A.
    Ohashi, H.
    Goto, S.
    Yamauchi, K.
    Ishikawa, T.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 616 (2-3): : 277 - 280
  • [43] Present status of upgraded long trace profiler for characterization of high-precision X-ray mirrors at SPring-8
    Senba, Y.
    Kishimoto, H.
    Ohashi, H.
    Yumoto, H.
    Goto, S.
    Ishikawa, T.
    ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS III, 2010, 7801
  • [44] X-RAY DIFFRACTION BY SYSTEMS OF LONG MOLECULES AND ONE-DIMENSIONAL X-RAY DIFFRACTION OF CELLULOSE
    KITAYGORODSKY, AI
    TSVANKIN, DY
    ACTA CRYSTALLOGRAPHICA, 1960, 13 (12): : 1142 - 1143
  • [45] High-precision soft x-ray polarimeter at Diamond Light Source
    Wang, H.
    Dhesi, S. S.
    Maccherozzi, F.
    Cavill, S.
    Shepherd, E.
    Yuan, F.
    Deshmukh, R.
    Scott, S.
    van der Laan, G.
    Sawhney, K. J. S.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (12):
  • [46] Compact high-precision soft X-ray and extreme ultraviolet reflectometer
    Ni, Qi-Liang
    Liu, Shi-Jie
    Chen, Bo
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2008, 16 (10): : 1886 - 1890
  • [48] High-precision x-ray diagnostics of laser-produced plasmas
    Renner, O
    Förster, E
    Uschmann, I
    Eidmann, K
    LASER OPTICS 2003: SUPERINTENSE LIGHT FIELDS AND ULTRAFAST PROCESSES, 2003, 5482 : 1 - 10
  • [49] High-precision x-ray spectroscopy in few-electron ions
    Le Bigot, E. O.
    Boucard, S.
    Covita, D. S.
    Gotta, D.
    Gruber, A.
    Hirtl, A.
    Fuhrmann, H.
    Indelicato, P.
    dos Santos, J. M. F.
    Schlesser, S.
    Simons, L. M.
    Stingelin, L.
    Trassinelli, M.
    Veloso, J. F. C. A.
    Wasser, A.
    Zmeskal, J.
    PHYSICA SCRIPTA, 2009, T134
  • [50] Automating High-Precision X-Ray and Neutron Imaging Applications With Robotics
    Hashem, Joseph A.
    Pryor, Mitch
    Landsberger, Sheldon
    Hunter, James
    Janecky, David R.
    IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2018, 15 (02) : 663 - 674